Research & Development

Intern for our Metrology Lab for Thin Film Analytics & Advanced Characterisation (1 year contract)

location_on 瑞士
business On-Site
schedule Full-Time 80-100%
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Job Description

As an Intern in the Metrology Lab, you work with cutting-edge thin-film metrology tools and analyse complex samples. You support our team across various analysis and development tasks and grow your technical expertise significantly. With your curiosity and hands-on attitude, you actively contribute to research and technology development.

What you will be doing

  • check Analyse samples: you prepare samples, run measurements (SEM‑FIB, XRD/XRR, XRF, Ellipsometry, UV‑Vis/FTIR) and document results
  • check Develop measurement models: you support the creation and optimisation of ellipsometry models
  • check Evaluate data: you analyse measurement data and identify clear insights
  • check Expand know-how: you learn new measurement techniques and strengthen your metrology skills
  • check Collaborate: you exchange regularly with internal and external teams

What you should bring

  • check Relevant studies: you are a Master’s or PhD student in Materials Science, Physics, Chemistry, Nano or similar
  • check Initial metrology experience: you have first exposure to SEM‑FIB, XRD/XRR, XRF, Ellipsometry or FTIR
  • check Analytical mindset: you work precisely and can interpret data reliably
  • check Communication & IT: you communicate well in English; Python skills are a plus
  • check Hands-on approach: you work independently, curious and pragmatic

Is it a match?

For further information please contact
Veronique Dölger | TA Specialist | hr.eag@evatecnet.com

p.s. applications submitted via recruitment agencies are not considered

Join us!